Data for: Residual polymer stabiliser causes anisotropic conductivity in metal nanoparticle 2D and 3D printed electronics

Trindade, Gustavo F.; Roberts, Clive

dc.contributor.author	Trindade, Gustavo F.
dc.contributor.author	Roberts, Clive
dc.contributor.other	Hague, Richard
dc.contributor.other	Wildman, Ricky
dc.contributor.other	Tuck, Chris
dc.contributor.other	Turyanska, Lyudmila
dc.contributor.other	Scurr, David
dc.contributor.other	Saleh, Ehab
dc.contributor.other	Pervan, David
dc.contributor.other	Tiddia, Mariavitalia
dc.contributor.other	Gilmore, Ian
dc.contributor.other	Balogh, Adam
dc.contributor.other	He, Yinfeng
dc.contributor.other	Im, Jisun
dc.contributor.other	Wang, Feiran
dc.date.accessioned	2020-10-30T10:03:49Z
dc.date.available	2020-10-30T10:03:49Z
dc.date.issued	2020-10-30
dc.identifier.uri	https://rdmc.nottingham.ac.uk/handle/internal/8618
dc.description.abstract	Experimental data for manuscript "Residual polymer stabiliser causes anisotropic conductivity in metal nanoparticle 2D and 3D printed electronics". Contents: - Raw and exported ToF-SIMS and orbiSIMS data (.itmx and .txt) - Raw and exported XPS data (.vms and .txt) - All used electron micrographs (.tiff + .txt formats) - Electrical resistivity measurements - DSC data	en_UK
dc.language.iso	en	en_UK
dc.publisher	The University of Nottingham	en_UK
dc.relation.uri	https://github.com/guferraz/simsMVA	en_UK
dc.relation.uri	https://www.iontof.com/	en_UK
dc.relation.uri	https://mvatools.com/	en_UK
dc.relation.uri	http://www.casaxps.com/	en_UK
dc.relation.uri	https://imagej.nih.gov/ij/	en_UK
dc.rights	CC-BY	*
dc.rights.uri	https://creativecommons.org/licenses/by/4.0/	*
dc.subject.lcsh	Printed electronics	en_UK
dc.subject.lcsh	Three-dimensional printing	en_UK
dc.subject.lcsh	Additive manufacturing	en_UK
dc.subject.lcsh	Electron microscopy	en_UK
dc.subject.lcsh	Mass spectrometry	en_UK
dc.title	Data for: Residual polymer stabiliser causes anisotropic conductivity in metal nanoparticle 2D and 3D printed electronics	en_UK
dc.identifier.doi	http://doi.org/10.17639/nott.7084
dc.subject.free	ToF-SIMS, orbiSIMS, mass spectrometry, imaging mass spectrometry, XPS, X-ray photoelectron spectroscopy, 4-point probe resistivity test, electron microscopy, SEM, digital scanning calorimetry, DSC	en_UK
dc.subject.jacs	Engineering	en_UK
dc.subject.jacs	Technologies	en_UK
dc.subject.lc	T Technology	en_UK
dc.contributor.corporate	National Physical Laboratory	en_UK
uon.division	University of Nottingham, UK Campus::Faculty of Science::School of Pharmacy	en_UK
uon.division	University of Nottingham, UK Campus::Faculty of Engineering::Department of Mechanical, Materials and Manufacturing Engineering	en_UK
uon.division	University of Nottingham, UK Campus::Faculty of Science::School of Physics and Astronomy	en_UK
uon.funder.controlled	Engineering & Physical Sciences Research Council	en_UK
uon.datatype	Experimental analytical data	en_UK
uon.grant	EP/P031684/1	en_UK
uon.grant	EP/P029868/1	en_UK
uon.collectionmethod	Various	en_UK
uon.institutes-centres	University of Nottingham, UK Campus::Nottingham Nanotechnology and Nanoscience Centre	en_UK
uon.institutes-centres	University of Nottingham, UK Campus::Advanced Manufacturing, Institute for	en_UK
uon.preservation.rarelyaccessed	true