Ultra-high resolution imaging of thin films and single strands of polythiophene using atomic force microscopy
Description
Images and related analysis relevant to this research publication.
External URI
Subjects
- Thin films
- Polymers
- Optoelectronic devices
- Atomic force microscopy
- polythiophene, atomic force microscopy, boron nitride
- Physical sciences::Chemistry::Physical chemistry
- Physical sciences::Physics::Chemical physics, Solid-state physics
- Q Science::QD Chemistry::QD450 Physical and theoretical chemistry
- Q Science::QC Physics::QC170 Atomic physics. Constitution and properties of matter
Divisions
- University of Nottingham, UK Campus::Faculty of Science::School of Physics and Astronomy
- University of Nottingham, UK Campus::Faculty of Science::School of Chemistry
Deposit date
2019-04-05Data type
Images acquired using scanning probe microscopy, analysis programmesContributors
- Summerfield, Alex
- Korolkov, Vladimir
- Amabilino, David
- Murphy, Alanna
Funders
- Engineering & Physical Sciences Research Council
- Leverhulme Trust
Grant number
- EP/P019080/1
- EP/N033906/1
- RPG-2016-104
Data collection method
Asylum Cypher Atomic Force MicroscopeResource languages
- en