Defect-Induced Doping and Chemisorption of O2 in Se Deficient GaSe Monolayers
Description
Original data for the Owing to their atomically thin nature, structural defects in two dimensional materials often play a dominating role in their electronic and optical properties. Here, we grow epitaxial GaSe monolayers on graphene/SiC by molecular beam epitaxy and characterise the layers by in situ scanning tunnelling microscopy and angle-resolved photoemission spectroscopy extracted from k-resolved photoemission electron microscopy mapping. We identify an electric dipole at the GaSe/graphene interface, with electrons accumulating on the GaSe, that cannot be compensated by p-type doping through the creation of defects formed by annealing in ultrahigh vacuum. Additionally, we demonstrate that both as-grown and defective GaSe layers are remarkably resilient to oxidation in a pure O2 environment, and chemisorption of O2 molecules on the surface can effectively electronically neutralise the doping in the layer. This work demonstrates the robust interlayer interaction in the GaSe/graphene van der Waals heterostructure and the role of defects on the doping for nanoelectronics.
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Subjects
- Molecular beam epitaxy
- Crystal growth
- Layer structure (Solids)
- Two-dimensional materials
- gallium selenide, in situ characterisation, molecular beam epitaxy, STM, ARPES, van der Waals epitaxy
- Physical sciences::Physics
- Q Science::QC Physics::QC170 Atomic physics. Constitution and properties of matter
Divisions
- University of Nottingham, UK Campus::Faculty of Science::School of Physics and Astronomy
Deposit date
2024-11-22Data type
Scanning tunnelling microscopy images and photoemission spectraContributors
- Rahman, Kazi
- Felton, James
- Cheng, Tin
- Shiffa, Mustaqeem
- Beton, Peter
- Saywell, Alex
- Greenaway, Mark
- Novikov, Sergei
- O'Shea, James
- patane, amalia
Funders
- Engineering & Physical Sciences Research Council
- Royal Society
Grant number
- EP/T019018/1
- EP/V05323X/1
- EP/V008110/1
- EP/W035510/1
Collection dates
- 2023
Data collection method
Scanning tunnelling microscopy, photoemission spectroscopyResource languages
- en