Data are stored in the following directories:

AFM Ð AFM images of In2Se3 on mica, SiO2, graphite which can be viewed using freeware WSxM or Gwyddion.

Devices Ð measured electrical characteristics which can be analysed using Origin.

Optical images Ð showing devices and grown material Ð standard viewing packages available on Windows, Apple and other standard operating systems.

PL Ð photoluminescence data which can be analysed using Origin

Raman Ð Raman spectra which can be analysed using Origin

XPS Ð X-ray photoelectron spectroscopy data

X-ray Diffraction Ð XRD data which can be read using Excel

Directory Structure:

--DATA
  +---AFM
  ¦   +---Exfoliated alpha-In2Se3
  ¦   +---Films grown on Mica
  ¦   +---Films grown on SiO2
  +---Devices
  +---Optical Images
  ¦   +---Device
  ¦   +---Growth on Graphite
  ¦   +---Growth on mica
  ¦   +---Growth on SiO2 substrate
  +---PL
  +---Raman
  +---XPS
  +---XRD